IEC 60749-12-2002 半导体器件.机械和气候试验方法.第12部分: 振动,可变频率

标准号：IEC 60749-12-2002
中文标准名称：半导体器件.机械和气候试验方法.第12部分: 振动,可变频率
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. In general, this variable frequency vibration test is in conformity with IEC 60068-2-6 but, due to specific requirements of semiconductors, the clauses of this standard apply.