DIN EN 61967-4-2006 集成电路.150 kHz - 1 kHz 电磁辐射的测量.第4部分:传导释放量的测量.1Ω/150Ω直接耦合法 (IEC 61967-4:2002 + A1:2
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标准号:DIN EN 61967-4-2006
中文标准名称:集成电路.150 kHz - 1 kHz 电磁辐射的测量.第4部分:传导释放量的测量.1Ω/150Ω直接耦合法 (IEC 61967-4:2002 + A1:2006)
英文标准名称:Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (IEC 61967-4:2002 + A1:2006); German version EN 61967-4:2002 + A1:2006
标准类型:L56
发布日期:1999/12/31 12:00:00
实施日期:2006/7/1 12:00:00
中国标准分类号:L56
国际标准分类号:31.200;33.100.10
引用标准:IEC 61000-4-6;IEC 61967-1;CISPR 16-1-1;CISPR 16-1-2;CISPR 16-1-3
适用范围:This part of DIN EN 61967 specifies a method to measure the conducted electromagnetic emision (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 O resistive probe and RF voltage measurement using a 150 O coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements.
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