DIN 41850-3-1985 薄膜集成电路.第3部分:材料、介电糊剂的评价方法

标准号：DIN 41850-3-1985
中文标准名称：薄膜集成电路.第3部分:材料、介电糊剂的评价方法
英文标准名称：Integrated film circuits; methods for the assessment of dielectric pastes
标准类型：L55
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L55
国际标准分类号：31.200
适用范围：The standard describes procedures for the assessment of dielectric pastes to be used in integrated film circuits. Thereby the suitability is to diffentiate for the three main applications cross-over, dielectric and protective coating. The tests, necessary for this assessment, are carried out by means of a test substrat the layout of which is laid down in this standard.#,,#