BS EN 14571-2005 非金属基底材料上的金属覆层.覆层厚度的测量.微电阻率法

标准号：BS EN 14571-2005
中文标准名称：非金属基底材料上的金属覆层.覆层厚度的测量.微电阻率法
英文标准名称：Metallic coatings on nonmetallic basis materials - Measurement of coating thickness - Microresistivity method
标准类型：A29
发布日期：2005/5/3 12:00:00
实施日期：2005/5/3 12:00:00
中国标准分类号：A29
国际标准分类号：17.040.20;25.220.40
适用范围：This document describes a method for nondestructive measurements of the thickness of conductive coatings on nonconductive base materials. This method is based on the principle of the sheet resistivity measurement and is applicable to any conductive coatings and layers of metal and semiconductor materials. In general, the probe has to be adjusted to the conductivity and the thickness of the respective application. However, this document focusses on metallic coatings on nonconductive base materials (e.g. Copper on plastic substrates, printed circuit boards). NOTE 1 This method also applies to the measurement of through-hole copper thickness of printed circuit boards. However, for this application a probe geometry different from the one described in this document is necessary. NOTE 2 This method is also applicable for thickness measurements of conductive coatings on conductive base materials, if the resistivity of the coating and the base material is different. This case is not considered in this document.