BS EN 60444-9-2007 石英晶体元件参数测量.压电晶体元件寄生振荡测量

标准号：BS EN 60444-9-2007
中文标准名称：石英晶体元件参数测量.压电晶体元件寄生振荡测量
英文标准名称：Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
标准类型：L21
发布日期：2007/5/31 12:00:00
实施日期：2007/5/31 12:00:00
中国标准分类号：L21
国际标准分类号：31.140
适用范围：This part of IEC 60444 describes two methods for determining the spurious (unwanted) modesof piezoelectric crystal resonators. It extends the capabilities and improves the reproducibilityand accuracy compared to previous methods.The previous methods described in IEC 60283 (1968) were based on the use of a measuringbridge, which applies to non-traceable components such as variable resistors and a hybridtransformer, which are no longer commercially available.Method A (Full parameter determination)Full parameter determination allows the determination of the equivalent parameters of thespurious resonances and is based on the methods described in IEC 60444-5 using the samemeasurement equipment. It is the preferred method, which can be applied to themeasurement of low and medium impedance spurious resonances up to several kΩ.Method B (Resistance determination)Resistance determination should be used for the determination of high impedance spuriousresonances as specified, for example for certain filter crystals. It uses the same testequipment as method A in conjunction with a test fixture, which consists of commerciallyavailable microwave components such as a 180° hybrid coupler and a 10 dB attenuator, whichare well-defined in a 50 Ω environment. This method is an improvement to the “referencemethod” of the obsolete IEC 60283.