BS DD ISO/TS 13762-2002 粒径分析.小角度X射线散射法

标准号：BS DD ISO/TS 13762-2002
中文标准名称：粒径分析.小角度X射线散射法
英文标准名称：Particle size analysis - Small angle X-ray scattering method
标准类型：N50
发布日期：2002/12/4 12:00:00
实施日期：2002/12/4 12:00:00
中国标准分类号：N50
国际标准分类号：19.120
适用范围：This Technical Specification specifies the method for determining particle size distribution of ultra-fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped. The method described in this Technical Specification is also applicable to particle suspensions. This Technical Specification does not apply to: a) powders containing particles whose morphology is far from spherical, except by special agreement; b) powders consisting of porous particles; c) mixtures of powders.