BS EN 60749-2-2002 半导体装置.机械和气候试验方法.低气压

标准号：BS EN 60749-2-2002
中文标准名称：半导体装置.机械和气候试验方法.低气压
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Low air pressure
标准类型：L40
发布日期：2002/9/24 12:00:00
实施日期：2002/9/24 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：This part of IEC 60749 covers the testing of low air pressure on semiconductor devices. Thetest is intended primarily to determine the ability of component parts and materials to avoidvoltage breakdown failures due to the reduced dielectric strength of air and other insulatingmaterials at reduced pressures. This test is only applicable to devices where the operatingvoltage exceeds 1 000 V.This test is applicable to all semiconductor devices provided they are in cavity type packages.The test is intended for military and space-related applications only.In general, this test of low air pressure is in conformity with IEC 60068-2-13 but, due tospecific requirements of semiconductors, the clauses of this standard apply.