IEC/PAS 62164 Edition 1.0-2000 GaAs MMIC和FET寿命试验的指南

标准号：IEC/PAS 62164 Edition 1.0-2000
中文标准名称：GaAs MMIC和FET寿命试验的指南
英文标准名称：Guidelines for GaAs MMIC and FET life testing
标准类型：K04
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：K04
国际标准分类号：31.080.01
适用范围：Life tests are run for various purposes. Tests run to detect the level of infant mortality involve short time durations; unless the percentage of devices having infant mortality is extremely high, the sample size specified in this document is not nearly sufficient. Tests to determine device lifetime for a specific application may be conducted It is assumed that a given MMIC product is designated either as a power, general purpose, or low-noise (or small-signal) device, based on the intended use of the product. For low- noise devices and passive components, the RF voltage levels are small enough that it may be possible to simulate the stress accurately by imposing only dc stress conditions.This document applies both to packaged and unpackaged devices. Where the devices are bare die or in packages not suitable for stressing except in sockets, additional failures may occur, due to the packaging, which are not considered part of the product being tested. If this occurs, such failures should be excluded from the population when calculating predicted failure rate.Since it is not likely that every structure and failure mechanism in an MMIC is known when these guidelines are written, some judgment must be used in applying the principles of this document to the specific tests. Where an unusual circumstance forces exceptions to these guidelines, the exception shall be stated in the life test report.