ISO/TR 14999-1-2005 光学和光子学.光学元件和光学系统的干涉仪测量.第1部分:术语、定义和基本关系

标准号：ISO/TR 14999-1-2005
中文标准名称：光学和光子学.光学元件和光学系统的干涉仪测量.第1部分:术语、定义和基本关系
英文标准名称：Optics and photonics - Interferometric measurement of optical elements and optical systems - Part 1: Terms, definitions and fundamental relationships
标准类型：N30
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：N30
国际标准分类号：37.020
适用范围：This part of ISO/TR 14999 gives terms, definitions and fundamental physical and technical relationships forinterferometric measurements of optical wavefronts and surface form of optical elements.It explains why some principles of the construction and use of interferometers are important due to the wavenature of the wavefronts to be measured.Since all wavefronts with the exception of very extended plane waves do alter their shape when propagating,this part of ISO/TR 14999 also includes some basic information about wave propagation.In practice, interferometric measurements can be done and are done by use of various configurations; thispart of ISO/TR 14999 outlines the basic configurations for two-beam interference.The mathematical formulation of optical waves by the concept of the complex amplitude as well as the basicequations of two-beam interference are established to explain the principles of deriving the phase informationout of the measured intensity distribution, either in time or in space.Both random and systematic errors may affect the results of interferometric measurements and error types tobe clearly differentiated are therefore described in this part of ISO/TR 14999.