IS 12860-1989

标准号：IS 12860-1989
发布日期：1990/5/1 12:00:00
实施日期：1999/12/31 12:00:00
适用范围：1.1 This method covers the use of X-ray Fluorescence (XRF) techniques for determining the thickness of metallic coatings. This technique is applicable to stationary as well as moving samples.1.2 This standard is applicable to the determi-nation of mass of coating per unit area as well as coating thickness. The general principles presented here are applicable to the determi-nation of the thickness of most metallic coatings on any substrate, metallic or non-metallic. The maximum measurable thickness for a given coating is that thickness beyond which the inten-sity of the characteristic secondary X-rays no longer changes by a significant amount with increase in thickness.