IEEE 1450.1 Errata-2005 半导体设计环境用标准试验接口语言(STIL)的扩展(IEEE Std 1450-1999)

标准号：IEEE 1450.1 Errata-2005
中文标准名称：半导体设计环境用标准试验接口语言(STIL)的扩展(IEEE Std 1450-1999)
英文标准名称：Extension to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for semiconductor design environments
标准类型：L74
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L74
国际标准分类号：35.060
适用范围：Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language are defined that a) facilitate the use of the language in the design environment and b) facilitate the use of the language for large designs encompassing sub-designs with reusable patterns.