BS EN 160200-2-1998 电子元器件质量评定协调体系.分规范:经质量评定的微波模数电子器件.试验方法索引

标准号：BS EN 160200-2-1998
中文标准名称：电子元器件质量评定协调体系.分规范:经质量评定的微波模数电子器件.试验方法索引
英文标准名称：Harmonized system of quality assessment for electronic components - Sectional specification - Microwave modular electronic units of assessed quality - Index of test methods
标准类型：L10
发布日期：1998/3/15 12:00:00
实施日期：1998/3/15 12:00:00
中国标准分类号：L10
国际标准分类号：31.190
适用范围：This Part 2 of the Sectional Specification EN 160200 defines standard/reference test methods for Electrical, Mechanical and Visual Inspection as prescribed in Part 1 of the Sectional Specification EN 160200 and Blank Detail Specification EN 160201 for Microwave Modular Electronic Units (MMEUs). Section three of EN 160200-1 details general requirements for test and measurement procedures (including environmental test requirements). This Standard specifies a wide range of documents which relate to microwave test methods. Many of which are not covered by IEC or CECC specifications. Although a number of test methods are under preparation by IEC and CECC they are considered acceptable for use in this Standard. Where test methods have been considered suitable for insertion into this Standard they are either referenced under clause 2.4 - Standard Test Methods or detailed in full under clause 2.5 - Special Test Methods. Examples of MMEUs which are covered by these test methods are: - Amplifiers - Attenuators - Couplers/Power dividers - Filters - Isolators/Circulators - Limiters - Mixers - Noise Sources - Oscillators - Phase Shifters - Switches - Transmitters (e.g. Integrated Multichannel) Guidance on the prime electrical characteristics to be measured is given in annex C of the Blank Detail Specification (BDS) - EN 160201. This Part 2 of EN 160200 will be reviewed as other test methods become available.