IEC 61000-4-17-1999 电磁兼容性(EMC) 第4-17部分:试验和测量技术 直流输入电力端口上的纹 抗扰度试验

标准号：IEC 61000-4-17-1999
中文标准名称：电磁兼容性(EMC) 第4-17部分:试验和测量技术 直流输入电力端口上的纹 抗扰度试验
英文标准名称：Electromagnetic compatibility (EMC) - Part 4-17: Testing and measuring techniques - Ripple on d.c. input power port, immunity test
标准类型：L06
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L06
国际标准分类号：33.100.20
适用范围：This part oflEC 61000 defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. This standard is applicable to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. The object of this standard is to establish a common and reproducible basis for testing, in a laboratory, electrical and electronic equipment when subjected to ripple voltages such as those generated by rectifier systems and/or auxiliary service battery chargers overlaying on d.c. power supply sources. This standard defines - test voltage waveform; - range of test levels; - test generator; - test set-up; - test procedure. The test described hereafter applies to electrical or electronic equipment and systems. It also applies to modules or subsystems whenever the equipment under test (EUT) rated power is greater than the test generator capacity specified in clause 6. This test does not apply to equipment connected to battery charger systems incorporating switch mode converters. This standard does not specify the tests to be applied to particular apparatus or systems. Its main aim is to give a general basic reference to IEC product committees. These product committees (or users or manufacturers of equipment) remain responsible for the appropriate choice of the test and the severity level to be applied to their equipment. Dedicated test procedures are in use for testing specific categories of electrical or electronic equipment, e.g. equipment connected to d.c. supply network of telephone switching centres; the related product committees should evaluate the relevance and applicability of the test procedure specified in this basic standard.