BS EN 60749-10-2002 半导体装置.机械和气候试验方法.机械振动

标准号：BS EN 60749-10-2002
中文标准名称：半导体装置.机械和气候试验方法.机械振动
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Mechanical shock
标准类型：L40
发布日期：2002/8/28 12:00:00
实施日期：2002/8/28 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. In general, this mechanical shock test is in conformity with IEC 60068-2-27 but, due to specific requirements of semiconductors, the clauses of this standard apply.