标准号:DIN EN 60749-5-2003
中文标准名称:半导体器件.机械和气候试验方法.第5部分:稳态温度湿度偏差寿命试验
英文标准名称:Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003); German version EN 60749-5:2003
标准类型:L40
发布日期:1999/12/31 12:00:00
实施日期:2003/9/1 12:00:00
中国标准分类号:L40
国际标准分类号:31.080.01
适用范围:This part of DIN EN 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.