IEC 60749-30-2005 半导体器件.机械和气候试验方法.第30部分:可靠性试验之前不气密的表面安装器件的预调试

标准号：IEC 60749-30-2005
中文标准名称：半导体器件.机械和气候试验方法.第30部分:可靠性试验之前不气密的表面安装器件的预调试
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical