BS EN ISO 3274-1998 几何产品规范(GPS).表面特征.轮廓法.接触装置的标定特性

标准号：BS EN ISO 3274-1998
中文标准名称：几何产品规范(GPS).表面特征.轮廓法.接触装置的标定特性
英文标准名称：Geometric product specifications (GPS) - Surface texture - Profile method - Nominal characteristics of contact (stylus) instruments
标准类型：J04
发布日期：1997/5/15 12:00:00
实施日期：1997/5/15 12:00:00
中国标准分类号：J04
国际标准分类号：17.040.20
适用范围：This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be applied to practical profile evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and profile recorder). NOTES 1 A data sheet dealing with characteristics of contact (stylus) instruments to be completed by the instrument makers is under preparation and will be introduced in a future standard on calibration procedures. 2 The relationships between the waviness cut-off λf, tip radius and waviness cut-off ratio are under consideration and will be added to this International Standard as an amendment.