IEEE 1450-1999 数字试验向量的标准界面试验语言(STIL)

标准号：IEEE 1450-1999
中文标准名称：数字试验向量的标准界面试验语言(STIL)
英文标准名称：Standard Interface Test Language (STIL) for Digital Test Vectors IEEE Computer Society
标准类型：L74
发布日期：1999/3/18 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L74
国际标准分类号：35.060
适用范围：This project is to define a standard language that a) facilitates the transfer of large volumes of digital test information from computer Aided-Engineering (CAE) environments to Automated Test Equipment (ATE) environments; b) specifies pattern, format, and timing information sufficient to define the application of test vectors to a Device Under Test (DUT); c) supports the large bulk test information generated from structured test and integral test techniques for very large scale and ultra large scale integrated circuit designs in a format optimized for transportation and application in Automated Test Equipment (ATE) environments; d) supports device testing for integrated circuit, very large scale and ultra large scale integrated circuit test environments, but not restricted from application to other digital test environments.