IEC 60749-4-2017 半导体器件.机械和气候试验方法.第4部分:湿热,稳态,高加速应力试验

标准号：IEC 60749-4-2017
中文标准名称：半导体器件.机械和气候试验方法.第4部分:湿热,稳态,高加速应力试验
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
引用标准：IEC 60749-5-2003
适用范围：This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.