标准号:BS EN 60749-4-2002
中文标准名称:半导体器件.机械和气候试验方法.湿热、稳态态、高加速应力试验(HAST)
英文标准名称:Semiconductor devices - Mechanical and climatic test methods - Damp heat, steady state, highly accelerated stress test (HAST)
标准类型:L40
发布日期:2002/9/10 12:00:00
实施日期:2002/9/10 12:00:00
中国标准分类号:L40
国际标准分类号:31.080.01
适用范围:This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.