SIS SS IEC 333-1986 核检测仪表．半导体带电微粒探测器测试程序

标准号：SIS SS IEC 333-1986
中文标准名称：核检测仪表．半导体带电微粒探测器测试程序
英文标准名称：Nuclear instrumentation - Testprocedures for semiconductor chargedparticle detectors
发布日期：1986/6/25 12:00:00
实施日期：1999/12/31 12:00:00
适用范围：This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.Test procedures for the associated amplifiers and preamplifiers are described in IEC Publication 340: Test Procedures for Amplifiers and Preamplifiers for Semiconductor Detectors for Ionizing Radiation.