标准号:IEC 60749-26-2013
中文标准名称:半导体器件.机械和气候试验方法.第26部分:静电放电敏感性(ESD)测试.人体模型(HBM)
英文标准名称:Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
标准类型:L40
发布日期:1999/12/31 12:00:00
实施日期:1999/12/31 12:00:00
中国标准分类号:L40
国际标准分类号:31.080.01
引用标准:IEC 60749-27
适用范围:This standard establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation byexposure to a defined human body model (HBM) electrostatic discharge (ESD).