标准号:DIN EN 60749-12-2003
中文标准名称:半导体器件.机械和气候试验方法.第12部分: 变频振动
英文标准名称:Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002
标准类型:L40
发布日期:1999/12/31 12:00:00
实施日期:2003/4/1 12:00:00
中国标准分类号:L40
国际标准分类号:31.080.01
适用范围:The document describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages