ISO 13084-2011 表面化学分析.二次离子质谱分析法.飞行时间二次离子质谱仪用质量标度的校准

标准号：ISO 13084-2011
中文标准名称：表面化学分析.二次离子质谱分析法.飞行时间二次离子质谱仪用质量标度的校准
英文标准名称：Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
标准类型：G04
发布日期：2011/5/15 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：G04
国际标准分类号：71.040.40
适用范围：This International Standard specifies a method to optimize the mass calibration accuracy in time-of-flight SIMSinstruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is notrestricted to any particular instrument design. Guidance is provided for some of the instrumental parametersthat can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scalefor optimum mass accuracy.