IEC 60748-21-1-1997 半导体器件 集成电路 第21-1部分:实行鉴定批准程序的膜集成电路和混合膜集成电路空白详细规范

标准号：IEC 60748-21-1-1997
中文标准名称：半导体器件 集成电路 第21-1部分:实行鉴定批准程序的膜集成电路和混合膜集成电路空白详细规范
英文标准名称：Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
标准类型：L56
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L56
国际标准分类号：31.200
适用范围：Semiconductor devices -Integrated circuits -Characteristics and conditions of use.....................................................................Recommended methods of mounting.....................................................................Marking.................................................................................................................Ordering information..............................................................................................Certified records of released lots...........................................................................Additional information............................................................................................Additional or increased severities or requirements to those specified in the generic and/or sectional specification.................................................................................Inspection requirements (see tables 2 and 3 or 4 and 5).........................................Supplement -Tables of method B..........................................................................Part 21-1:Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures