DIN EN 60749-9-2003 半导体器件.机械和气候试验方法.第9部分:标记耐久性

标准号：DIN EN 60749-9-2003
中文标准名称：半导体器件.机械和气候试验方法.第9部分:标记耐久性
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2002); German version EN 60749-9:2002
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：2003/4/1 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：The purpose of this part of DIN EN 60749 is to test and verify that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.