BS EN 61967-4-2002 集成电路.150kHz～1GHz电磁辐射的测量.第4部分:传导辐射的测量.1ohm/150ohm直接耦合法

标准号：BS EN 61967-4-2002
中文标准名称：集成电路.150kHz～1GHz电磁辐射的测量.第4部分:传导辐射的测量.1ohm/150ohm直接耦合法
英文标准名称：Integrated circuits — Measurement of electromagnetic emissions, 150 kHz to 1 GHz — Part 4: Measurement of conducted emissions — 1 ohm/150 ohm direct coupling method
标准类型：L56
发布日期：2002/8/19 12:00:00
实施日期：2002/8/19 12:00:00
中国标准分类号：L56
国际标准分类号：31.200
引用标准：IEC 61000-4-6;IEC 61967-1;CISPR 16-1-1;CISPR 16-1-2;CISPR 16-1-3;CISPR 16-1-4;CISPR 16-1-5
适用范围：This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.