IEC 60749-31-2002 半导体器件.机械和气候试验方法.第31部分:塑料密封器件的易燃性(内部感应)

标准号：IEC 60749-31-2002
中文标准名称：半导体器件.机械和气候试验方法.第31部分:塑料密封器件的易燃性(内部感应)
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to internal heating caused by excessive overloads. NOTE This test is identical to the test method contained in 1.1 of chapter 4 of IEC 60749 (1996), apart from changes to this clause, the addition of titles to clauses 2 and 3 and renumbering.