ISO 18756-2003 细陶瓷(高级陶瓷、高级工业陶瓷).用弯曲时的表面裂纹(SCF)法测定室温下块体陶瓷的断裂韧性

标准号：ISO 18756-2003
中文标准名称：细陶瓷(**陶瓷、**工业陶瓷).用弯曲时的表面裂纹(SCF)法测定室温下块体陶瓷的断裂韧性
英文标准名称：Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of fracture toughness of monolithic ceramics at room temperature by the surface crack in flexure (SCF) method
标准类型：Q32
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：Q32
国际标准分类号：81.060.30
适用范围：This International Standard describes a test method that covers the determination of fracture toughness of monolithic ceramic materials at room temperature by the surface crack in flexure (SCF) method. This International Standard is intended for use with monolithic ceramics and whisker- or particulate-reinforced ceramics that are regarded as macroscopically homogeneous. It does not include continuous-fibre reinforced ceramic composites. The test method is applicable to materials with either flat or rising crack growth resistance curves. This method is similar to ISO 15732 except that precracks are smaller and are made by a different procedure. The methods should produce similar or identical results for materials with a flat R-curve. NOTE This test method is usually applicable to ceramic materials with a fracture toughness less than ≈ 10 MPa m