IEC 61967-1-2002 集成电路.150kHz-1GHz电磁辐射的测量.第1部分:一般条件和定义

标准号：IEC 61967-1-2002
中文标准名称：集成电路.150kHz-1GHz电磁辐射的测量.第1部分:一般条件和定义
英文标准名称：Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
标准类型：L56
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L56
国际标准分类号：01.040.31;31.200
适用范围：This part of IEC 61967 provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included as annex A to assist in selecting the appropriate measurement method(s). The object of this standard is to describe general conditions in order to establish a uniform testing environment and obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measure-ment results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.