IEC 62527-2007 DC等级规范用标准测试接口语言(STIL)扩展的标准

标准号：IEC 62527-2007
中文标准名称：DC等级规范用标准测试接口语言(STIL)扩展的标准
英文标准名称：Standard for extensions to Standard Test Interface Language (STIL) for DC level specification
标准类型：L74
发布日期：2007/11/1 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L74
国际标准分类号：25.040;35.060
引用标准：IEEE Std 1450-1999
适用范围：This standard defines the following:a) Defines structures in STIL for specifying the DC conditions for a DUT. Examples of the DC conditions for device power supplies are DPS setup, power sequencing to the device, and power supply limiting/clamping. Examples of the DC conditions for commonly used signal references are VIL, VIH, VOL, VOH, IOL, IOH, VREF, VClampLow, and VClampHi.b) Defines structures I STIL such that the DC conditions may be specified either globally, by pattern burst, by pattern, or by vector.c) Defines structures in STIL to allow specification of alternate DC levels, Examples of commonly used alternate levels are VIHH, VIPP, and VILL.d) Defines structures in STIL such that the DC levels and alternate levels can be selected within a period, much the same as timed format events.