ISO 12179-2000 产品几何量技术规范(GPS) 表面结构:轮廓法 接触(触针)式仪器的校准

标准号：ISO 12179-2000
中文标准名称：产品几何量技术规范(GPS) 表面结构:轮廓法 接触(触针)式仪器的校准
英文标准名称：Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
标准类型：J04
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：J04
国际标准分类号：17.040.30
适用范围：This International Standard applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is to be carried out with the aid of measurement standards. Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.