BS EN 14784-2-2005 无损检验.用存储荧光成像板的工业计算辐射摄影术.用X射线和γ射线检验金属材料的一般原则

标准号：BS EN 14784-2-2005
中文标准名称：无损检验.用存储荧光成像板的工业计算辐射摄影术.用X射线和γ射线检验金属材料的一般原则
英文标准名称：Non-destructive testing - Industrial computed radiography with storage phosphor imaging plates - General principles for testing of metallic materials using X-rays and gamma rays
标准类型：H26
发布日期：2005/9/27 12:00:00
实施日期：2005/9/27 12:00:00
中国标准分类号：H26
国际标准分类号：19.100
适用范围：This European Standard specifies fundamental techniques of computed radiography with the aim of enabling satisfactory and repeatable results to be obtained economically. The techniques are based on the fundamental theory of the subject and tests measurements. This document specifies the general rules for industrial computed X-and gamma radiography for flaw detection purposes, using storage phosphor imaging plates (IP). It is based on the general principles for radiographic examination of metallic materials on the basis of films (EN 444 and ISO 5579). The basic set-up of radiation source, detector and the corresponding geometry shall be applied in agreement with EN 444 and ISO 5579 and the corresponding product standards as e.g. EN 1435 for welding and EN 12681 for foundry. It does not lay down acceptance criteria of the imperfections.