BS EN 60749-17-2003 半导体器件.机械和气候试验方法.中子辐照

标准号：BS EN 60749-17-2003
中文标准名称：半导体器件.机械和气候试验方法.中子辐照
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Neutron irradiation
标准类型：L40
发布日期：2003/6/19 12:00:00
实施日期：2003/6/19 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. The tests described herein are applicable to integrated circuits and discrete semiconductor devices. This test is intended for military-and space-related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 4).