IEC 62132-3-2007 集成电路.150kHz～1GHz电磁抗扰性的测量.第3部分:大容量电流注入(BCI)法

标准号：IEC 62132-3-2007
中文标准名称：集成电路.150kHz～1GHz电磁抗扰性的测量.第3部分:大容量电流注入(BCI)法
英文标准名称：Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
标准类型：L56
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L56
国际标准分类号：31.200
引用标准：IEC 62132-1-2006
适用范围：This part of IEC 621 32 describes a bulk current injection(BCI)test method to measure the immunity of integrated circuts(IC) in the presence of conducted RF disturbances，e．g．resulting from radiated RF disturbances．This method only applies to ICs that have off-board Wire connections e. g．into a cable harness．This test method is used to inject RF current on one or a combjnation of wires．This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals．