BS EN 62132-1-2006 集成电路.150 kHz～1 GHz电磁抗扰性的测量.通用条件和定义

标准号：BS EN 62132-1-2006
中文标准名称：集成电路.150 kHz～1 GHz电磁抗扰性的测量.通用条件和定义
英文标准名称：Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - General conditions and definitions
标准类型：L56
发布日期：2006/6/30 12:00:00
实施日期：2006/6/30 12:00:00
中国标准分类号：L56
国际标准分类号：31.200;33.100.20
引用标准：IEC 61000-4-3;IEC 61000-4-6
适用范围：This part of IEC 62132 provides general information and definitions on measurement ofconducted and radiated electromagnetic immunity of integrated circuits (ICs) to conductedand radiated disturbances. It also provides a description of measurement conditions, testequipment and set-up, as well as the test procedures and content of the test reports. A testmethod comparison table is included in Annex A to assist in selecting the appropriatemeasurement method(s).This standard describes general conditions required to obtain a quantitative measure ofimmunity of ICs in a uniform testing environment. Critical parameters that are expected toinfluence the test results are described. Deviations from this standard are noted explicitly inthe individual test report. The measurement results can be used for comparison or otherpurposes.Measurement of the injected voltages and currents, together with the responses of the ICstested at controlled conditions, yields information about the potential immunity of the IC toconducted and radiated RF disturbances in a given application.