ANSI/TIA-455-197-2000 利用微分相移法进行单模元器件和装置的群时延差测量

标准号：ANSI/TIA-455-197-2000
中文标准名称：利用微分相移法进行单模元器件和装置的群时延差测量
英文标准名称：Differential Group Delay Measurement of Single-Mode Components and Devices by the Differential Phase Shift Method
标准类型：M33
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：M33
国际标准分类号：33.180.20
适用范围：Describes a procedure in which a modulated light source at a given wavelength is coupled into the component under test, and the phase of the modulated signal existing the fiber at a first polarization state is compared with the phase at a second, orthogonal polarization state.