BS EN 60749-9-2002 半导体器件.机械和气候试验方法.永久性标记

标准号：BS EN 60749-9-2002
中文标准名称：半导体器件.机械和气候试验方法.永久性标记
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Permanence of marking
标准类型：L40
发布日期：2002/9/24 12:00:00
实施日期：2002/9/24 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：The purpose of this part of IEC 60749 is to test and verify that the markings onsemiconductor devices will not become illegible when subject to solvents or cleaning solutionscommonly used during the removal of solder flux residue from the printed circuit boardassembly process.This test is applicable for all package types. It is suitable for use in qualification and/orprocess monitor testing. The test should be considered non-destructive. Electrical ormechanical rejects may be used for the purpose of this test.In general, this test of permanence of marking is in conformity with IEC 60068-2-45 but, dueto specific requirements of semiconductors, the clauses of this standard apply.