DIN EN 60749-2-2003 半导体器件.机械和气候试验方法.第2部分:低气压

标准号：DIN EN 60749-2-2003
中文标准名称：半导体器件.机械和气候试验方法.第2部分:低气压
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：2003/4/1 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：This part of DIN EN 60749 covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures. This test is only applicable to devices where the operating voltage exceeds 1000 V.