BS EN 60749-3-2002 半导体器件.机械和气候试验方法.目视检验

标准号：BS EN 60749-3-2002
中文标准名称：半导体器件.机械和气候试验方法.目视检验
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - External visual examination
标准类型：L40
发布日期：2002/8/27 12:00:00
实施日期：2002/8/27 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance, or both.