DIN EN 60749-13-2003 半导体器件.机械和气候试验方法.第13部分: 盐雾

标准号：DIN EN 60749-13-2003
中文标准名称：半导体器件.机械和气候试验方法.第13部分: 盐雾
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002); German version EN 60749-13:2002
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：2003/4/1 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：The document describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.