IEC 62132-2-2010 集成电路.电磁抗扰度测量.第2部分:辐射抗干扰的测定.横电磁波传输室和宽带横电磁波传输室方法

标准号：IEC 62132-2-2010
中文标准名称：集成电路.电磁抗扰度测量.第2部分:辐射抗干扰的测定.横电磁波传输室和宽带横电磁波传输室方法
英文标准名称：Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
标准类型：L56
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L56
国际标准分类号：31.200;33.100.20
引用标准：IEC 60050-131-2002;IEC 60050-161-1990;IEC 61967-2;IEC 62132-1-2006
适用范围：This International Standard specifies a method for measuring the immunity of an integratedcircuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequencyrange of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.