BS EN 165000-4-1996 薄膜集成电路和混合集成电路.用户信息,产品评估第级一览表和空白详细规范

标准号：BS EN 165000-4-1996
中文标准名称：薄膜集成电路和混合集成电路.用户信息,产品评估第级一览表和空白详细规范
英文标准名称：Film and hybrid integrated circuits. Customer information, product assessment level schedules and blank detail specification
标准类型：L57;L58
发布日期：1996/10/15 12:00:00
实施日期：1996/10/15 12:00:00
中国标准分类号：L57;L58
国际标准分类号：31.200
适用范围：Film and hybrid integrated circuits Part 4. Customer information, product assessment level schedules and blank detail specification 1 Introduction 1.1 How EN 165000 works 1.2 Customer/manufacturer interface 1.3 The product assessment level schedules 1.3.1 Derivation of the product assessment level schedules 1.3.2 Indication of applications for the product assessment level schedules 1.4 Test requirements of the PALS and their applicability to real life application 1.4.1 The origin of the inspection requirements 1.4.2 Electrical tests 1.4.3 Other screening tests 1.4.4 Device sample testing 1.4.5 Design evaluation testing 1.4.6 AQLs, inspection levels and sampling plans 2 Product assessment level schedules and detail specifications PALS 1-11 3 Blank detail specification requirements Front page for standard catalogue circuits Front page for customer circuits Section one —general data Section two —inspection requirements Example of a customer detail specification Tables 1 PALS for solder or chip & wire (non-hermetic) assembly 2 PALS for chip & wire (hermetic) assembly