BS DD IEC/TS 62215-2-2007 集成电路.脉冲抗扰度的测量.同步瞬时注射法

标准号：BS DD IEC/TS 62215-2-2007
中文标准名称：集成电路.脉冲抗扰度的测量.同步瞬时注射法
英文标准名称：Integrated circuits - Measurement of impulse immunity - Synchronous transient injection method
标准类型：L56
发布日期：2007/11/30 12:00:00
实施日期：2007/11/30 12:00:00
中国标准分类号：L56
国际标准分类号：31.200
适用范围：IEC/Ts 62215-2，which is a technical specification，contains general information and definitions on the test method to evaluate the immunity of integrated circuits(ICs)against fast conducted synchronous transient disturbances．This information is followed by a description of measurement conditions，test equipment and test set—up as well as the test procedures and the requirements on the content of the test report． the objective of this technical specification is to describe general conditions to obtain a quantitative measure of immunity of ICs establishing a uniform testing environment．Critical parameters that are expected to influence the test results are described．Deviations from this specification should be explicitly noted in the individual test report． this synchronous transient immunity measurement method，as described in this specification． uses short impulses with fast rise times of different amplitude，duration and polarity in a conductive mode to the IC．In this method，the applied impulse should be synch ronized with the activity of the IC to make sure that controlled and reproducible conditions can be assured．