IEC 62528-2007 嵌入式基于芯片的集成电路用标准可试性方法

标准号：IEC 62528-2007
中文标准名称：嵌入式基于芯片的集成电路用标准可试性方法
英文标准名称：Standard testability method for embedded core-based integrated circuits
标准类型：L56
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L56
国际标准分类号：31.200
引用标准：IEEE Std 1149.1;IEEE P1450.6
适用范围：IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containingembedded nonmergeable cores. This method is independent of the underlying functionality of the IC orits individual embedded cores. The method creates the necessary requirements for the test of such ICs, whileallowing for ease of interoperability of cores that may have originated from different sources.