SIS SS-ISO 9220-1989 金属涂层．涂层厚度测量．扫描电子显微镜方法

标准号：SIS SS-ISO 9220-1989
中文标准名称：金属涂层．涂层厚度测量．扫描电子显微镜方法
英文标准名称：Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
发布日期：1989/12/6 12:00:00
实施日期：1999/12/31 12:00:00
适用范围：This International Standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron micro-scope (SEM). It is destructive and has an uncertainty of less than 10 % or 0,1 |jm, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a light microscope (ISO 1463) when applicable.