IEC/PAS 62162 Edition 1.0-2000 微电子元件抗静电放电域值的场诱导放电装置模型的试验方法

标准号：IEC/PAS 62162 Edition 1.0-2000
中文标准名称：微电子元件抗静电放电域值的场诱导放电装置模型的试验方法
英文标准名称：Filed-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
标准类型：L50
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L50
国际标准分类号：31.080.01
适用范围：All packaged semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. The test methods described in this standard may also be used to evaluate components that are shipped as wafers or bare chips. To perform the tests, the components must be assembled into a package similar to that expected in the final application. The package used shall be recorded.