DIN EN 60749-6-2003 半导体器件.机械和气候试验方法.第6部分:高温储存

标准号：DIN EN 60749-6-2003
中文标准名称：半导体器件.机械和气候试验方法.第6部分:高温储存
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002); German version EN 60749-6:2003
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：2003/4/1 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：The purpose of this part of DIN EN 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification.