BS EN 60749-33-2004 半导体器件.机械和气候试验方法.加速耐湿性.无偏差压热器

标准号：BS EN 60749-33-2004
中文标准名称：半导体器件.机械和气候试验方法.加速耐湿性.无偏差压热器
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave
标准类型：L40
发布日期：2004/6/22 12:00:00
实施日期：2004/6/22 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetic packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors passing through it. This test is used to identify failure mechanisms internal to the package and is destructive.