IEC 60749-38-2008 半导体器件.机械和气候试验方法.第38部分:带存储器的半导体器件用软错误试验法

标准号：IEC 60749-38-2008
中文标准名称：半导体器件.机械和气候试验方法.第38部分:带存储器的半导体器件用软错误试验法
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：This part of IEC 60749 establishes a procedure for measuring the soft error susceptibility ofsemiconductor devices with memory when subjected to energetic particles such as alpharadiation. Two tests are described; an accelerated test using an alpha radiation source and an(unaccelerated) real-time system test where any errors are generated under conditions ofnaturally occurring radiation which can be alpha or other radiation such as neutron. Tocompletely characterize the soft error capability of an integrated circuit with memory, thedevice must be tested for broad high energy spectrum and thermal neutrons using additionaltest methods. This test method may be applied to any type of integrated circuit with memorydevice.